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January 19, 2016


SolveTech is announcing high performance technology to provide basis weight uniformity/thickness both on line and in the lab for thin nonwoven materials.

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Wilmington, DE, January 19, 2016– SolveTech has now adapted their proprietary, non-nuclear gauging
systems to meet the needs of nonwoven producers and converters.  They have taken their PR2000 Profiler, MultiChannel and FX21000 which have been very successful in the plastic film industry and modified them for use in the nonwoven industry.

“We are excited about introducing our technology to the nonwoven market.  It has now been proven to provide a unique value to producers and purchasers of nonwoven materials that want to inspect uniformity”-Doug Lawrence, President, SolveTech, Inc.

Their capacitance based gauging technology is being custom configured to provide basis weight or weight per unit area uniformity for thin nonwovens less than 0.25” thick.  After several successful trial installations, SolveTech is confident in the technologies superior performance on nonwoven materials.

The proprietary technology is not a point measurement.  Instead it averages basis weight over a specified area, similar to a cut and weigh measurement.  This greatly reduces the noise in the reading due to the rough nature of the material and can in many cases read with accuracies 1% or better depending on process conditions.  It is also fast, producing data every 0.01 seconds on the FX2100, completely customizable, and not sensitive to optical properties.  The technology has no nuclear or x-ray hazards which eliminates regulatory headaches.

Below, the lab gauge is profiling the uniformity of a nonwoven material and producing a graph showing the variability in basis weight along the strip in the graph to the right.

IMG_0564Nonwoven Basis Weight

 

 

 

 

 

 

A profile of the sample variability is created using the PR2000 Precision Profiler

SolveTech will be presenting the technology at the RISE Conference held by INDA on January 26th, 2016.

 

SolveTech, Inc. is based in Wilmington, DE USA and has been making thickness gauging solutions for over 35 years.  They specialize in proprietary capacitance based non-contacting measurement systems for non-conductive materials and offer free sample testing for equipment evaluation.

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If you would like more information about this topic, please contact Rob Lawrence at 302-798-5400 or email at [email protected].

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